IJEDST 2016 Volume 4 Issue 10

International Journal of Education, Development, Society and Technology (IJEDST) ISSN: 2321 – 7537

IJBST Journal Group -- Open Access -- NO Fees -- NO Processing Charges -- 100% Non Profit Initiatives

The IJBST Journal Group subscribes to the San Francisco Declaration on Research Assessment and the The European Code of Conduct for Research Integrity
The IJBST Journal Group Archive can also be accessed at https://archive.org/details/IJBSTJournalGroup

PDF Format:
SWF Format:

Linear Relationship of Different Variables between University Entrance Exam Scores and Grade Point Averages of Technical Education Faculty Students
Irem Ersöz Kaya1,* and Y.Gürcan Ültanır2
1 Department of Software Engineering, Tarsus Technology Faculty, Mersin University, Mersin, Turkey; iremer@mersin.edu.tr
2 Faculty of Education, Ufuk University, Ankara, Turkey; gultanir@hotmail.com
IJEDST (2016), 4(10):93-99

The objective of this study is to show the correlation between Student Selection and Placement Exam (OSYS) scores and Grade Point Averages (GPA) of students who registered in the Technical Education Faculty in 2005 and to what extent OSYS scores can predict success. It was examined whether or not a linear relationship between OSYS scores and the GPA of each academic year exists. Besides the factors including gender, type of secondary education school attended, and the regions of student origin were researched. In order to discover a qualitative reason for this, a survey was conducted asking students open-ended questions. From the end of the first year onwards, the predictive validity of OSYS scores shows a significant correlation close to zero. For other academic years, there has been no significant correlation observed. At the same time, the OSYS scores and degree GPA at graduation can scarcely be predicted.
Keywords: Student selection and placement exam, Predictive validity, Regression analysis, Academic success.

Prof. Dr. Prabhu Britto Albert,
Dec 25, 2016, 6:23 AM
Prof. Dr. Prabhu Britto Albert,
Dec 25, 2016, 6:23 AM